Aehr Test Systems CEO and leadership

Joined the Company as President and Chief Executive Officer in January 2012. Prior to joining Aehr, Mr. Erickson served as Corporate Officer and Senior Vice President & General Manager of Verigy’s memory test business. Prior to that, Mr. Erickson was Vice President of Marketing and Sales for Agilent Technologies’ Semiconductor Memory Test products. He has over 23 years of executive and general management, operations,marketing, sales, and R&D program management experience dating back to the late 1980s, when he began his career in semiconductor test with Hewlett-Packard’s Automated Test Group. He received a B.S. in Electrical Engineering from Arizona State University.

Kenneth 'Ken' Spink is a VP:Finance/CFO at AEHR TEST SYSTEMS. He has experience at Applied Materials and Deloitte and has worked as Controller at AEHR TEST SYSTEMS. Kenneth attended California State University San Marcos.

Joined the Company as Vice President of Engineering in October 2000. From 1999 to 2000, Mr. Hendrickson served as Platform General Manager, and from 1995 to 1999 as Engineering Director and Software Director, of Siemens Medical (formerly Acuson Corporation), a medical ultrasound products company. From 1990 to 1995, Mr. Hendrickson served as Director of Engineering and Director of Software of Teradyne Inc. (formerly Megatest Corporation), a manufacturer of semiconductor capital equipment. Mr. Hendrickson received a B.S. in Computer Science from Illinois Institute of Technology.

Joined the Company as President and Chief Executive Officer in January 2012. Prior to joining Aehr, Mr. Erickson served as Corporate Officer and Senior Vice President & General Manager of Verigy’s memory test business. Prior to that, Mr. Erickson was Vice President of Marketing and Sales for Agilent Technologies’ Semiconductor Memory Test products. He has over 23 years of executive and general management, operations,marketing, sales, and R&D program management experience dating back to the late 1980s, when he began his career in semiconductor test with Hewlett-Packard’s Automated Test Group. He received a B.S. in Electrical Engineering from Arizona State University.